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Filters: Author is Pollock, Tresa M. and Keyword is Imaging defects  [Clear All Filters]
2018
Lenthe WC, Stinville JCharles, Echlin MP, Chen Z, Daly S, Pollock TM.  2018.  Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging. Ultramicroscopy. 195:93–100.