Publications

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Filters: Author is Echlin, McLean P and Keyword is Electron backscatter diffraction  [Clear All Filters]
2025
Ventura NMDella, Ericks AR, Echlin MLP, Moore K, Pollock TM, Begley MR, Zok FW, De Graef M, Gianola DS.  2025.  Direct electron detection for EBSD of low symmetry & beam sensitive ceramics. Ultramicroscopy. 268:114079.