Publications

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Filters: Author is Wang, Fulin and Keyword is Sparse sampling  [Clear All Filters]
2021
Wang F, Echlin MP, Taylor AA, Shin J, Bammes B, Levin BDA, De Graef M, Pollock TM, Gianola DS.  2021.  Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. 220:113160.