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Wang F, Echlin MP, Taylor AA, Shin J, Bammes B, Levin BDA, De Graef M, Pollock TM, Gianola DS.  2021.  Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. 220:113160.
Wang F, Balbus GH, Xu S, Su Y, Shin J, Rottmann PF, Knipling KE, Stinville JCharles, Mills LH, Senkov ON et al..  2020.  Multiplicity of dislocation pathways in a refractory multiprincipal element alloy. Science. 370:95–101.
Wang F, Stinville J-C, Charpagne M-agathe, Echlin M, Agnew S, Pollock T, Graef M, Gianola D.  2023.  Dislocation cells in additively manufactured metallic alloys characterized by electron backscatter diffraction pattern sharpness. Materials Characterization. 197:112673.