Transmission electron microscopy study of complex planar faults in Ru–Al–0.5 at.% B

TitleTransmission electron microscopy study of complex planar faults in Ru–Al–0.5 at.% B
Publication TypeJournal Article
Year of Publication2004
AuthorsLu D-C, De Graef M, Pollock† TM
JournalPhilosophical Magazine
Volume84
Pagination2317–2329