Terahertz characterization of interfacial oxide layers and voids for health monitoring of ceramic coatings

TitleTerahertz characterization of interfacial oxide layers and voids for health monitoring of ceramic coatings
Publication TypeConference Paper
Year of Publication2008
AuthorsChen C-C, Lee D-J, Pollock T, Whitaker JF
Conference Name2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves