Publications

Found 2 results
Author Title Type [ Year(Asc)]
Filters: Author is Y. Gan  [Clear All Filters]
2015
E.A. Flores-Johnson, T.J. Rupert, K.J. Hemker, D.S. Gianola, and Y. Gan. "Modelling wrinkling interactions produced by patterned defects in metal thin films." Extreme Mechanics Letters 4 (2015): 175-185. (3.41 MB)
2009
T.J. Rupert, D.S. Gianola, Y. Gan, and K.J. Hemker. "Experimental observations of stress-driven grain boundary migration." Science 326 (2009): 1686. (0 bytes)