Publications

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2018
Callahan, Patrick, Jean-Charles Stinville, Eric Yao, McLean P. Echlin, Jungho Shin, Fulin Wang, Marc De Graef, Tresa M. Pollock, and Daniel S. Gianola. "Defect Characterization using Transmission Scanning Electron Microscopy." Microscopy and Microanalysis 24 (2018): 1836-1837.