| Title | Stress-driven surface topography evolution in nanocrystalline Al thin films |
| Publication Type | Journal Article |
| Year of Publication | 2008 |
| Authors | D.S. Gianola, C. Eberl, X.M. Cheng, and K.J. Hemker |
| Journal | Advanced Materials |
| Volume | 20 |
| Pagination | 303–308 |
| DOI | 10.1002/adma.200701607 |
