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T.N. Ng, M.L. Chabinyc, R.A. Street, and A. Salleo. "Bias stress effects in organic thin film transistors." In 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL, 243+. International Reliability Physics Symposium. 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE, 2007.