Publications

Found 2 results
Author Title Type [ Year(Asc)]
Filters: Author is H. Yan  [Clear All Filters]
2014
E. Gann, Anne Watson, John R. Tumbleston, J.E. Cochran, H. Yan, C. Wang, Jaewook Seok, M.L. Chabinyc, and H. Ade. "Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique." PHYSICAL REVIEW B 90 (2014): 245421.
2012
B.A. Collins, J.E. Cochran, H. Yan, E. Gann, C. Hub, R. Fink, C. Wang, T. Schuettfort, C.R. McNeill, M.L. Chabinyc et al. "Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films." NATURE MATERIALS 11 (2012): 536-543.