Publications

Found 7 results
Author Title Type [ Year(Desc)]
Filters: Author is M. Legros  [Clear All Filters]
2004
D.S. Gianola, K.J. Hemker, M. Legros, and W.N. Sharpe, Jr.. "Experimental techniques for uncovering deformation mechanisms in nanocrystalline Al thin films." TMS Letters 1 (2004): 149. (1.39 MB)
2006
D.S. Gianola, S. Van Petegem, M. Legros, S. Brandstetter, H. Van Swygenhoven, and K.J. Hemker. "Stress-assisted discontinuous grain growth and its effect on the deformation behavior of nanocrystalline aluminum thin films." Acta materialia 54 (2006): 2253-2263. (762.93 KB)
2008
M. Legros, D.S. Gianola, and K.J. Hemker. "In situ TEM observations of fast grain-boundary motion in stressed nanocrystalline aluminum films." Acta Materialia 56 (2008): 3380-3393. (1.54 MB)
2009
M. Legros, M. Cabié, and D.S. Gianola. "In situ deformation of thin films on substrates." Microscopy Research and Technique 72 (2009): 270-283. (620.05 KB)
2010
M. Legros, D.S. Gianola, and C. Motz. "Quantitative in situ mechanical testing." MRS BULLETIN 35 (2010). (680.05 KB)
2012
F. Mompiou, M. Legros, T. Radetic, U. Dahmen, D.S. Gianola, and K.J.Hemker. "In situ TEM observation of grain annihilation in tricrystalline aluminum films." Acta Materialia 60 (2012): 2209-2218. (1.67 MB)
F. Mompiou, M. Legros, A. Sedlmayr, D.S. Gianola, D. Caillard, and O. Kraft. "Source-based strengthening of sub-micrometer Al fibers." Acta Materialia 60 (2012): 977-983. (955.5 KB)