| Title | Characterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics |
| Publication Type | Journal Article |
| Year of Publication | 2019 |
| Authors | Eggeler, YM, EE Levin, F Wang, R Seshadri, TM Pollock, and DS Gianola |
| Journal | Microscopy and Microanalysis |
| Volume | 25 |
| Pagination | 1916–1917 |