Characterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics

TitleCharacterisation of Misfit Dislocations at Semicoherent Interfaces in Biphasic Functional Heusler Intermetallics
Publication TypeJournal Article
Year of Publication2019
AuthorsEggeler, YM, EE Levin, F Wang, R Seshadri, TM Pollock, and DS Gianola
JournalMicroscopy and Microanalysis
Volume25
Pagination1916–1917