In situ nanomechanical testing in focused ion beam and scanning electron microscopes

TitleIn situ nanomechanical testing in focused ion beam and scanning electron microscopes
Publication TypeJournal Article
Year of Publication2011
AuthorsD.S. Gianola, A. Sedlmayr, R. Mönig, C.A. Volkert, R.C. Major, E. Cyrankowski, S.A.S. Asif, O.L. Warren, and O. Kraft
JournalReview of Scientific Instruments
Volume82
Pagination063901
DOI10.1063/1.3595423