Publications

Found 3 results
Author [ Title(Asc)] Type Year
Filters: Author is E. Gann  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
T
E. Gann, Anne Watson, John R. Tumbleston, J.E. Cochran, H. Yan, C. Wang, Jaewook Seok, M.L. Chabinyc, and H. Ade. "Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique." PHYSICAL REVIEW B 90 (2014): 245421.
P
B.A. Collins, J.E. Cochran, H. Yan, E. Gann, C. Hub, R. Fink, C. Wang, T. Schuettfort, C.R. McNeill, M.L. Chabinyc et al. "Polarized X-ray scattering reveals non-crystalline orientational ordering in organic films." NATURE MATERIALS 11 (2012): 536-543.
C
R. Di Pietro, I. Nasrallah, J. Carpenter, E. Gann, L.S. Koelln, L. Thomsen, D. Venkateshvaran, K.A. O'Hara, A. Sadhanala, M.L. Chabinyc et al. "Coulomb Enhanced Charge Transport in Semicrystalline Polymer Semiconductors." ADVANCED FUNCTIONAL MATERIALS 26 (2016): 8011-8022.