|Title||Transient strain induced electronic structure modulation in a semiconducting polymer imaged by scanning ultrafast electron microscopy|
|Publication Type||Journal Article|
|Year of Publication||2021|
|Authors||Kim, Taeyong, Saejin Oh, Usama Choudhry, Carl Meinhart, Michael L. Chabinyc, and Bolin Liao|
|Journal||arXiv preprint arXiv:2108.01502|
Understanding the opto-electronic properties of semiconducting polymers under external strain is essential for their applications in flexible opto-electronic, light-emitting and photovoltaic devices. While prior studies have highlighted the impact of static strains applied on a macroscopic length scale, assessing the effect of a local transient deformation before structural relaxation occurs is challenging due to the required high spatio-temporal resolution.