Export 4 results:Author Title [ Type] Year
Filters: Author is De Graef, Marc [Clear All Filters]
Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. 220:113160.. 2021.
A method for measuring microstructural-scale strains using a scanning electron microscope: applications to $\gamma$-titanium aluminides. Metallurgical and Materials Transactions A. 34:2301–2313.. 2003.
Twin related domain networks in René 88DT. Materials Characterization. 165:110365.. 2020.
Use of Weibull statistics to quantify property variability in TiAl alloys. Metallurgical and Materials Transactions A. 33:3127–3136.. 2002.