Publications

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2016
Rettberg LH, Goodlet BR, Pollock TM.  2016.  Detecting Recrystallization in a Single Crystal Ni-Base Alloy using Resonant Ultrasound Spectroscopy. NDT & E International.
Echlin MP, Titus M, Lenthe WC, Straw M, Gumbsch P, Pollock TM, Fraunhofer IWM.  2016.  Femtosecond Laser Damage in Metals and Semiconductors During TriBeam Tomography. Microsc. Microanal. 22:3.
Eggeler YM, Müller J, Titus MS, Suzuki A, Pollock TM, Spiecker E.  2016.  Planar defect formation in the g′ phase during high temperature creep in single crystal CoNi-base superalloys. Acta Materialia. 113:335–349.
Miller VM, Berman TD, Beyerlein IJ, Pollock TM.  2016.  Prediction of Magnesium Alloy Formability: The Role of Texture. Magnesium Technology 2016. :257–262.
Meher S, Carroll LJ, Pollock TM, Carroll MC.  2016.  Solute partitioning in multi-component $\gamma$/$\gamma$′ Co–Ni-base superalloys with near-zero lattice misfit. Scripta Materialia. 113:185–189.
Stinville JC, Echlin MP, Texier D, Bridier F, Bocher P, Pollock TM.  2016.  Sub-grain scale digital image correlation by electron microscopy for polycrystalline materials during elastic and plastic deformation. Experimental Mechanics. 56:197–216.
2017
Echlin MP, Titus MS, Gumbsch P, Pollock TM.  2017.  Materials response to glancing incidence femtosecond laser ablation. Acta Materialia. 124:46.
Stinville JC, Lenthe WC, Echlin MP, Callahan PG, Texier D, Pollock TM.  2017.  Microstructural Statistics for Fatigue Crack Initiation in Polycrystalline Nickel-base Superalloys. International Journal of Fracture. 208(1-2):240.
Kasemer M, Echlin MP, Stinville JC, Pollock TM, Dawson P.  2017.  On Slip Initiation in Equiaxed Alpha/Beta Ti-6Al-4V. Acta Materialia. 136
Nizolek T.j., Begley MR, McCabe RJ, Avallone JT, Mara NA, Beyerlein IJ, Pollock TM.  2017.  Strain fields induced by kink band propagation in Cu-Nb nanolaminate composites. Acta Materialia. 133:303–315.
2018
Callahan PG, Stinville JC, Yao ER, Echlin MP, Titus MS, De Graef M, Pollock TM, Gianola DS.  2018.  Transmission Scanning Electron Microscopy: Defect Observations and Image Simulations. Ultramicroscopy . 186

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