Publications
Export 3 results:
Author Title [ Type] Year Filters: Keyword is Scanning electron microscopy [Clear All Filters]
Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging. Ultramicroscopy. 195:93–100.
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2018. Measurements of plastic localization by heaviside-digital image correlation. Acta Materialia. 157:307–325.
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2018. Serial sectioning in the SEM for three dimensional materials science. Current Opinion in Solid State and Materials Science. :100817.
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2020.