Publications
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Author Title Type [ Year] Filters: Keyword is Scanning electron microscopy and Author is Pollock, Tresa M. [Clear All Filters]
Serial sectioning in the SEM for three dimensional materials science. Current Opinion in Solid State and Materials Science. :100817.
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2020. Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging. Ultramicroscopy. 195:93–100.
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2018.