@article {1686,
	title = {Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition},
	journal = {Ultramicroscopy},
	volume = {220},
	year = {2021},
	pages = {113160},
	abstract = {<p>
	A monolithic active pixel sensor based direct detector that is optimized for the primary beam energies in scanning electron microscopes is implemented for electron back-scattered diffraction (EBSD) applications. The high detection efficiency of the detector and its large array of pixels allow sensitive and accurate detection of Kikuchi bands arising from primary electron beam excitation energies of 4 keV to 28 keV, with the optimal contrast occurring in the range of 8\&ndash;16 keV. The diffraction pattern acquisition speed is substantially improved via a sparse sampling mode, resulting from the acquisition of a reduced number of pixels on the detector. Standard inpainting algorithms are implemented to effectively estimate the information in the skipped regions in the acquired diffraction pattern. For EBSD mapping, an acquisition speed as high as 5988 scan points per second is demonstrated, with a tolerable fraction of indexed points and accuracy. The collective capabilities spanning from high angular resolution EBSD patterns to high speed pattern acquisition are achieved on the same detector, facilitating simultaneous detection modalities that enable a multitude of advanced EBSD applications, including lattice strain mapping, structural refinement, low-dose characterization, 3D-EBSD and dynamic in situ EBSD.
</p>
},
	keywords = {Direct detection, EBSD, Indexing, Inpainting, SEM, Sparse sampling},
	issn = {18792723},
	doi = {10.1016/j.ultramic.2020.113160},
	url = {https://doi.org/10.1016/j.ultramic.2020.113160},
	author = {Wang, Fulin and Echlin, Mclean P. and Taylor, Aidan A. and Shin, Jungho and Bammes, Benjamin and Levin, Barnaby D.A. and De Graef, Marc and Pollock, Tresa M. and Gianola, Daniel S.}
}
@article {1586,
	title = {Twin related domain networks in Ren{\'e} 88DT},
	journal = {Materials Characterization},
	volume = {165},
	year = {2020},
	pages = {110365},
	abstract = {<p>
	Annealing twins in wrought fcc materials have historically been characterized using simple 2D measures including morphology and volume fraction. Accurately describing twin related domain microstructure requires accounting for their complex 3D structure. A large microstructural volume of a nickel-base alloy Ren\&eacute; 88DT has been collected using TriBeam tomography for full characterization of a large number of complete twin related domains. A network based approach enables visualization of twin domain structures. Metrics adapted from graph theory enable the first quantitative 3D microstructure descriptions. The implications for fatigue properties in twinned nickel-base alloys are discussed.
</p>
},
	keywords = {3D EBSD, Annealing twin boundaries, Graph theory, Nickel-base superalloy, Recrystallization, Tribeam, Twins},
	issn = {10445803},
	doi = {10.1016/j.matchar.2020.110365},
	url = {https://doi.org/10.1016/j.matchar.2020.110365},
	author = {Lenthe, William C. and Echlin, Mclean P. and Stinville, Jean C. and De Graef, Marc and Pollock, Tresa M.}
}
@article {biery2003method,
	title = {A method for measuring microstructural-scale strains using a scanning electron microscope: applications to $\gamma$-titanium aluminides},
	journal = {Metallurgical and Materials Transactions A},
	volume = {34},
	number = {10},
	year = {2003},
	pages = {2301{\textendash}2313},
	publisher = {Springer-Verlag},
	author = {Biery, Nicholas and De Graef, Marc and Pollock, Tresa M}
}
@article {biery2002use,
	title = {Use of Weibull statistics to quantify property variability in TiAl alloys},
	journal = {Metallurgical and Materials Transactions A},
	volume = {33},
	number = {10},
	year = {2002},
	pages = {3127{\textendash}3136},
	publisher = {Springer},
	author = {Biery, Nicholas and De Graef, Marc and Beuth, Jack and Raban, Rafel and Elliott, Andrew and Pollock, Tresa M and AUSTIN, CURT}
}
