@article {2266,
	title = {Q-RBSA: High-resolution 3D EBSD map generation using an efficient quaternion transformer network},
	journal = {npj Computational Materials},
	volume = {10},
	year = {2024},
	month = {Jan},
	doi = {10.1038/s41524-024-01209-6},
	author = {Jangid, Devendra K. and Brodnik, Neal R. and Echlin, Mclean P. and Gudavalli, Chandrakanth and Levenson, Connor and Pollock, Tresa M. and Daly, Samantha H. and Manjunath, B. S.}
}
@article {1451,
	title = {Grain size effects on NiTi shape memory alloy fatigue crack growth},
	journal = {Journal of Materials Research},
	volume = {33},
	year = {2018},
	pages = {91{\textendash}107},
	abstract = {<p>
	Fatigue cracking in polycrystalline NiTi was investigated using a multiscale experimental framework for average grain sizes (GS) from 10 to 1500 nm for the first time. Macroscopic fatigue crack growth rates, measured by optical digital image correlation, were connected to microscopic crack opening and closing displacements, measured by scanning electron microscope DIC (SEM-DIC) using a high-precision external SEM scan controller. Among all grain sizes, the 1500 nm GS sample exhibited the slowest crack growth rate at the macroscale, and the largest crack opening level (stress intensity at first crack opening) and minimum crack opening displacements at the microscale. Smaller GS samples (10, 18, 42, and 80 nm) exhibited nonmonotonic trends in their fatigue performance, yet the correlation was strong between macroscale and microscale behaviors for each GS. The samples that exhibited the fastest crack growth rates (42 and 80 nm GS) showed a small crack opening level and the largest crack opening displacements. The irregular trends in fatigue performance across the nanocrystalline GS samples were consistent with nonmonotonic values in the elastic modulus reported previously, both of which may be related to the presence of residual martensite only evident in the small GS samples (10 and 18 nm).
</p>
},
	keywords = {fatigue, nanostructure, scanning electron microscopy (SEM)},
	issn = {20445326},
	doi = {10.1557/jmr.2017.395},
	author = {Lepage, William S. and Ahadi, Aslan and Lenthe, William C. and Sun, Qing Ping and Pollock, Tresa M. and Shaw, John A. and Daly, Samantha H.}
}
