@article {2306,
	title = {Toward reliable ad-hoc scientific information extraction: A case study on two materials datasets},
	year = {2024},
	abstract = {<p>
	We explore the ability of GPT-4 to perform ad-hoc schema based information extraction from scientific literature. We assess specifically whether it can, with a basic prompting approach, replicate two existing material science datasets, given the manuscripts from which they were originally manually extracted. We employ materials scientists to perform a detailed manual error analysis to assess where the model struggles to faithfully extract the desired information, and draw on their insights to suggest research directions to address this broadly important task.
</p>
},
	author = {Ghosh, Satanu and Brodnik, Neal R and Frey, Carolina and Holgate, Collin and Pollock, Tresa M and Daly, Samantha and Carton, Samuel}
}
@article {1901,
	title = {Nondestructive quantification of single crystal elasticity for additively manufactured SB-CoNi-10C, IN625, and Ti64},
	journal = {NDT \& E International},
	volume = {135},
	year = {2023},
	month = {02},
	pages = {102803},
	doi = {10.1016/j.ndteint.2023.102803},
	author = {Rossin, Jeff and Leser, Patrick and Benzing, Jake and Torbet, Chris and Dillon, Robert and Smith, Stephen and Daly, Samantha and Pollock, Tresa}
}
@article {1831,
	title = {Perspective: Large Language Models in Applied Mechanics},
	journal = {Journal of Applied Mechanics},
	volume = {90},
	year = {2023},
	month = {06},
	pages = {1-12},
	doi = {10.1115/1.4062773},
	author = {Brodnik, Neal and Carton, Samuel and Muir, Caelin and Ghosh, Satanu and Downey, Doug and Echlin, Mclean and Pollock, Tresa and Daly, Samantha}
}
@conference {1836,
	title = {Titanium 3D Microstructure for Physics-based Generative Models: A Dataset and Primer},
	year = {2023},
	month = {07},
	author = {Jangid, Devendra and Brodnik, Neal and Echlin, Mclean and Daly, Samantha and Pollock, Tresa and Manjunath, B.}
}
@article {2016,
	title = {3D Grain Shape Generation in Polycrystals Using Generative Adversarial Networks},
	journal = {Integrating Materials and Manufacturing Innovation},
	volume = {11},
	year = {2022},
	month = {01},
	doi = {10.1007/s40192-021-00244-1},
	author = {Jangid, Devendra and Brodnik, Neal and Khan, Amil and Goebel, Michael and Echlin, Mclean and Pollock, Tresa and Daly, Samantha and Manjunath, B.}
}
@article {1911,
	title = {Adaptable physics-based super-resolution for electron backscatter diffraction maps},
	journal = {npj Computational Materials},
	volume = {8},
	year = {2022},
	month = {12},
	doi = {10.1038/s41524-022-00924-2},
	author = {Jangid, Devendra and Brodnik, Neal and Goebel, Michael and Khan, Amil and Majeti, SaiSidharth and Echlin, Mclean and Daly, Samantha and Pollock, Tresa and Manjunath, B.}
}
@article {1431,
	title = {Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging},
	journal = {Ultramicroscopy},
	volume = {195},
	year = {2018},
	pages = {93{\textendash}100},
	abstract = {<p>
	The advancement of materials science at the mesoscale requires improvements in both sampling volumes/areas and spatial resolution in order to make statistically significant measurements of microstructures that influence higher-order material properties, such as fatigue and fracture. Therefore, SEM-based techniques have become desirable due to improvements in imaging resolution, large sample handling capability, and flexibility for in-situ instrumentation. By using fast sampling of SEM electron detector signals, intrinsic beam scanning defects have been identified that are related to the response time of the SEM electron beam deflectors and electron detectors. Mitigation of these beam scanning defects using detector sampling approaches and an adaptive model for settling time is shown to produce higher resolution SEM images, at faster image acquisition times, with a means to quantify the different response functions for various beam deflectors and detectors including those for electrons and ions.
</p>
},
	keywords = {High resolution digital image correlation, Image processing, Imaging defects, Scan generator, Scanning electron microscopy, SEM},
	issn = {18792723},
	doi = {10.1016/j.ultramic.2018.08.025},
	url = {https://doi.org/10.1016/j.ultramic.2018.08.025},
	author = {Lenthe, William C. and Stinville, Jean Charles and Echlin, Mclean P. and Chen, Zhe and Daly, Samantha and Pollock, Tresa M.}
}
