@article {1416,
	title = {Automated and quantitative analysis of plastic strain localization via multi-modal data recombination},
	journal = {Materials Characterization},
	volume = {163},
	year = {2020},
	pages = {110245},
	issn = {10445803},
	doi = {10.1016/j.matchar.2020.110245},
	url = {https://linkinghub.elsevier.com/retrieve/pii/S1044580319335569},
	author = {Charpagne, M.A. and Stinville, J.C. and Callahan, P.G. and Texier, D. and Chen, Z. and Villechaise, P. and Valle, V. and Pollock, T.m.}
}
@conference {1616,
	title = {Tuning Strain Localization in Polycrystalline Nickel-Based Superalloys by Thermomechanical Processing},
	booktitle = {Superalloys 2020},
	year = {2020},
	publisher = {Springer International Publishing},
	organization = {Springer International Publishing},
	abstract = {<p>
	Thermomechanical processing routes are used to produce microstructures that minimize plastic strain localization at the sub-grain scale in a polycrystalline \&gamma; \&minus; \&gamma;\&$\#$39; nickel- based superalloy. This novel approach is made possible by the use of innovative experimental tools and statistical data analysis that capture slip events over large represen- tative fields of view. Results are correlated to conventional observations of fatigue crack initiation and early stage of propagation. The effect of coherent twin boundaries and primary \&gamma;\&$\#$39; precipitates on fatigue properties and plastic localization is detailed.
</p>
},
	keywords = {3D microstructure, Annealing twin boundaries, Nickel-based superalloy, Primary γ{\textquoteright} precipitates, Slip bands},
	isbn = {9783030518349},
	doi = {10.1007/978-3-030-51834-9},
	url = {http://dx.doi.org/10.1007/978-3-030-51834-9_65},
	author = {Charpagne, M. A. and Stinville, J. C. and Polonsky, A. T. and Echlin, M. P. and Murray, S. P. and Chen, Z. and Bozzolo, N. and Cormier, J. and Valle, V. and Pollock, T. M.},
	editor = {Tin, Sammy and Hardy, Mark and Clews, Justin and Cormier, Jonathan and Feng, Qiang and Marcin, John and O{\textquoteright}Brien, Chris and Suzuki, Akane}
}
@article {1461,
	title = {High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation},
	journal = {Experimental Mechanics},
	volume = {58},
	year = {2018},
	pages = {1407{\textendash}1421},
	abstract = {<p>
	This paper details the creation of experimental and computational frameworks to capture high-resolution, microscale deformation mechanisms and their relation to microstructure over large (mm-scale) fields of view. Scanning electron microscopy with custom automation and external beam control was used to capture 209 low-distortion micrographs of 360\&nbsp;\&mu;m \&times; 360\&nbsp;\&mu;m each, that were individually correlated using digital image correlation to obtain displacement/strain fields with a spatial resolution of 0.44\&nbsp;\&mu;m. Displacement and strain fields, as well as secondary electron images, were subsequently stitched to create a 5.7\&nbsp;mm\&nbsp;\&times;\&nbsp;3.4\&nbsp;mm field of view containing 100 million (7678 \&times; 13,004) data points. This approach was demonstrated on Mg WE43 under uniaxial compression, where effective strain was shown to be relatively constant with respect to distance from the grain boundary, and a noticeable increase in the effective strain was found with an increase in the basal Schmid factor. The ability to obtain high-resolution deformations over statistically relevant fields of view enables large data analytics to examine interactions between microstructure, microscale strain localizations, and macroscopic properties.
</p>
},
	keywords = {Alignment, Digital image correlation (DIC), Distortion, External scan, Stitching},
	issn = {17412765},
	doi = {10.1007/s11340-018-0419-y},
	author = {Chen, Z. and Lenthe, W. and Stinville, J. C. and Echlin, M. and Pollock, T. M. and Daly, S.}
}
