@article {1866,
	title = {Dislocation cells in additively manufactured metallic alloys characterized by electron backscatter diffraction pattern sharpness},
	journal = {Materials Characterization},
	volume = {197},
	year = {2023},
	month = {03},
	pages = {112673},
	doi = {10.1016/j.matchar.2023.112673},
	author = {Wang, Fulin and Stinville, Jean-Charles and Charpagne, Marie-agathe and Echlin, Mclean and Agnew, Sean and Pollock, Tresa and Graef, Marc and Gianola, Daniel}
}
@article {1356,
	title = {Dislocation dynamics in a nickel-based superalloy via in-situ transmission scanning electron microscopy},
	journal = {Acta Materialia},
	volume = {168},
	year = {2019},
	pages = {152{\textendash}166},
	abstract = {<p>
	Micro-tensile specimens of nickel-based superalloy oligocrystals were tested in-situ in an scanning electron microscope in transmission mode (TSEM) enabling observation of dislocations. The dynamics of dislocation motion during tensile loading were captured and correlated with the measured intermittencies during plastic flow recorded by high load- and temporal-resolution sensors. This investigation in particular focused on the dislocation behavior near twin boundaries with different slip configurations. A multiplicity of deformation mechanisms at the dislocation scale were observed within individual slip bands, including precipitate shearing, dislocation decorrelation and antiphase boundary-coupled shearing. These processes affect strain localization near twin boundaries and provide new defect-level insights on plastic localization and fatigue crack initiation in these alloys.
</p>
},
	keywords = {Dislocations dynamic, In-situ transmission scanning electron microscopy (TSEM), Nickel-based superalloy ren{\'e} 88DT, Plastic localization, STEM detector, Twin boundary},
	issn = {13596454},
	doi = {10.1016/j.actamat.2018.12.061},
	url = {https://doi.org/10.1016/j.actamat.2018.12.061},
	author = {Stinville, J. C. and Yao, Eric R. and Callahan, Patrick G. and Shin, Jungho and Wang, Fulin and Echlin, Mclean P. and Pollock, Tresa M. and Gianola, Daniel S.}
}
