@article {1461,
	title = {High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation},
	journal = {Experimental Mechanics},
	volume = {58},
	year = {2018},
	pages = {1407{\textendash}1421},
	abstract = {<p>
	This paper details the creation of experimental and computational frameworks to capture high-resolution, microscale deformation mechanisms and their relation to microstructure over large (mm-scale) fields of view. Scanning electron microscopy with custom automation and external beam control was used to capture 209 low-distortion micrographs of 360\&nbsp;\&mu;m \&times; 360\&nbsp;\&mu;m each, that were individually correlated using digital image correlation to obtain displacement/strain fields with a spatial resolution of 0.44\&nbsp;\&mu;m. Displacement and strain fields, as well as secondary electron images, were subsequently stitched to create a 5.7\&nbsp;mm\&nbsp;\&times;\&nbsp;3.4\&nbsp;mm field of view containing 100 million (7678 \&times; 13,004) data points. This approach was demonstrated on Mg WE43 under uniaxial compression, where effective strain was shown to be relatively constant with respect to distance from the grain boundary, and a noticeable increase in the effective strain was found with an increase in the basal Schmid factor. The ability to obtain high-resolution deformations over statistically relevant fields of view enables large data analytics to examine interactions between microstructure, microscale strain localizations, and macroscopic properties.
</p>
},
	keywords = {Alignment, Digital image correlation (DIC), Distortion, External scan, Stitching},
	issn = {17412765},
	doi = {10.1007/s11340-018-0419-y},
	author = {Chen, Z. and Lenthe, W. and Stinville, J. C. and Echlin, M. and Pollock, T. M. and Daly, S.}
}
