@article {1461, title = {High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation}, journal = {Experimental Mechanics}, volume = {58}, year = {2018}, pages = {1407{\textendash}1421}, abstract = {

This paper details the creation of experimental and computational frameworks to capture high-resolution, microscale deformation mechanisms and their relation to microstructure over large (mm-scale) fields of view. Scanning electron microscopy with custom automation and external beam control was used to capture 209 low-distortion micrographs of 360\ \μm \× 360\ \μm each, that were individually correlated using digital image correlation to obtain displacement/strain fields with a spatial resolution of 0.44\ \μm. Displacement and strain fields, as well as secondary electron images, were subsequently stitched to create a 5.7\ mm\ \×\ 3.4\ mm field of view containing 100 million (7678 \× 13,004) data points. This approach was demonstrated on Mg WE43 under uniaxial compression, where effective strain was shown to be relatively constant with respect to distance from the grain boundary, and a noticeable increase in the effective strain was found with an increase in the basal Schmid factor. The ability to obtain high-resolution deformations over statistically relevant fields of view enables large data analytics to examine interactions between microstructure, microscale strain localizations, and macroscopic properties.

}, keywords = {Alignment, Digital image correlation (DIC), Distortion, External scan, Stitching}, issn = {17412765}, doi = {10.1007/s11340-018-0419-y}, author = {Chen, Z. and Lenthe, W. and Stinville, J. C. and Echlin, M. and Pollock, T. M. and Daly, S.} }