Publications
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[ Author] Title Type Year Filters: First Letter Of Title is B and Author is T.N. Ng [Clear All Filters]
Bias stress effects in organic thin film transistors." In 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL, 243+. International Reliability Physics Symposium. 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE, 2007.
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