Publications
Found 2 results
Author Title [ Type] Year Filters: Keyword is organic semiconductors [Clear All Filters]
X-Ray Scattering Reveals Ion-Induced Microstructural Changes During Electrochemical Gating of Poly(3-Hexylthiophene)." Advanced Functional Materials 28 (2018): 1803687.
"Bias stress effects in organic thin film transistors." In 2007 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 45TH ANNUAL, 243+. International Reliability Physics Symposium. 345 E 47TH ST, NEW YORK, NY 10017 USA: IEEE, 2007.
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